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Patent Searching and Data


Title:
IONIZATION PROBE AND ION ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/049271
Kind Code:
A1
Abstract:
In the present invention, a duct holding part (221) for holding a PEEK relay tube (25) connected to a capillary (23) is fastened to a rotation locking part (222). The rotation locking part (222) can move freely in relation to a probe body (221) in the axial direction of the capillary (23), but the rotation of the rotation locking part (222) around the axis is restricted. A female thread part (223a) of a nut (223) that is made, via gears (225, 226), to rotate in conjunction with the operation of an adjustment knob (228) is screwed together with a male thread part (222b) of the rotation locking part (222). Because the rotation of the rotation locking part (222) is restricted, when the nut (223) is rotated, the site where the female thread part (223a) and male thread part (222b) are screwed together moves in the axial direction, and together with this movement, the rotation locking part (222) moves in the axial direction. As a result, the capillary (23) moves in the axial direction without rotating around the axis and the amount by which the capillary (23) projects relative to a gas ejection port is adjusted.

Inventors:
NAKANO TOMOHITO (JP)
Application Number:
PCT/JP2017/032299
Publication Date:
March 14, 2019
Filing Date:
September 07, 2017
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N27/62; H01J49/04
Domestic Patent References:
WO2013094093A12013-06-27
Foreign References:
US9095791B22015-08-04
JP2008021455A2008-01-31
JP2001343363A2001-12-14
JP2005135781A2005-05-26
JP2008071510A2008-03-27
US20050230617A12005-10-20
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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