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Patent Searching and Data


Title:
JOINED SUBSTRATE AND PRODUCTION METHOD FOR JOINED SUBSTRATE
Document Type and Number:
WIPO Patent Application WO/2020/184510
Kind Code:
A1
Abstract:
The present invention inhibits movement of silver from a protrusion portion due to an ion migration phenomenon to prevent occurrence of defects in a joined substrate caused by the movement of silver from the protrusion portion, while inhibiting a defect in the joined substrate caused by concentration of stress to an end portion of a copper plate. The joined substrate comprises a silicon nitride ceramic substrate, a copper plate, and a joining layer. The joining layer joins the copper plate to the silicon nitride ceramic substrate. The copper plate and the joining layer are disposed on the silicon nitride ceramic substrate. The joining layer comprises an inter-plate portion between the silicon nitride ceramic substrate and the copper plate, and a protrusion portion protruding from between the silicon nitride ceramic substrate and the copper plate. The protrusion portion does not contain silver.

Inventors:
EBIGASE TAKASHI (JP)
MASUDA IZUMI (JP)
Application Number:
PCT/JP2020/009983
Publication Date:
September 17, 2020
Filing Date:
March 09, 2020
Export Citation:
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Assignee:
NGK INSULATORS LTD (JP)
International Classes:
H01L23/13; H05K1/03; H05K3/38
Domestic Patent References:
WO2017200004A12017-11-23
WO2017006661A12017-01-12
WO2011034075A12011-03-24
Foreign References:
JP2018506496A2018-03-08
JP2005268821A2005-09-29
JP2001339155A2001-12-07
JP2017035805A2017-02-16
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
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