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Patent Searching and Data


Title:
JOINT EXAMINATION DEVICE, JOINING DEVICE, AND JOINT EXAMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/140098
Kind Code:
A1
Abstract:
This joint examination device (11), which examines the joining state of a joined structure obtained by joining a metal member (2, 2') and a resin member (3, 3') at a joining area (BF, BF'), is provided with: a temperature measurement means (14) for measuring the temperature of the metal member (2, 2'); and a determination means (15) which, in cases when the actually measured temperature measured by the temperature measurement means (14) is within a preset reference temperature range in which the joining state between the metal member (2, 2') and the resin member (3, 3') is normal, determines that the joining state is satisfactory.

Inventors:
NISHIKAWA KAZUYOSHI (JP)
Application Number:
PCT/JP2016/055102
Publication Date:
September 09, 2016
Filing Date:
February 22, 2016
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
B23K31/00; B23K26/00; B23K26/08; B23K26/402; B23K26/57; B29C65/16; B29C65/82
Foreign References:
JP2004122560A2004-04-22
JP2010046831A2010-03-04
JP2005007415A2005-01-13
Attorney, Agent or Firm:
ARC PATENT ATTORNEYS' OFFICE (JP)
Patent business corporation ARC PATENT ATTORNEYS' OFFICE (JP)
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