KELVIN CONTACT PROBE AND A KELVIN INSPECTION FIXTURE PROVIDED WITH SAME

WIPO Patent Application WO/2013/157033

A1

[Problem] To provide a Kelvin contact probe and a Kelvin inspection fixture provided with same capable of coping with the narrowing of electrode spacing regardless of the shape of the electrode of the unit to be inspected, and capable of avoiding increases to manufacturing costs for circuit boards. [Solution] A Kelvin inspection fixture (100) is provided with contact probes (10, 20), wherein the contact probe (10) comprises an electrode-side contact terminal (11) in contact with a solder ball (61), and a land-side contact terminal (12) in contact with a land (71), and the contact probe (20) comprises an electrode-side contact terminal (21) in contact with the solder ball (61), and a land-side contact terminal (22) in contact with a land (72). The contact probes (10, 20) are disposed so that an electrode-side inclined face (11f) and an electrode-side inclined face (21f) mutually face opposite directions and so that a land-side inclined face (12f) and a land-side inclined face (22f) mutually face each other.

NAKAMURA SHINICHI (JP)
NANAMI FUMIAKI (JP)

PCT/JP2012/002639

October 24, 2013

April 17, 2012

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UNITECHNO INC (JP)
NAKAMURA SHINICHI (JP)
NANAMI FUMIAKI (JP)

G01R1/073

JP2004279133A	2004-10-07
JP2008045986A	2008-02-28
JP2002350487A	2002-12-04
JP2003167001A	2003-06-13
JPH0723284U	1995-04-25
JP2004212233A	2004-07-29

ARIGA, GUNICHIRO (JP)
Ariga Army Ichiro (JP)

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