LABEL INSPECTION METHOD AND LABEL INSPECTION DEVICE

Title:

LABEL INSPECTION METHOD AND LABEL INSPECTION DEVICE

Document Type and Number:

WIPO Patent Application WO/2003/104780

Kind Code:

A1

Abstract:

A label inspection method and an inspection device which can positively detect the damaged condition of a label (L) even when the label (L) is transparent or semi-transparent, and positively detect the positional deviation of the label (L) from a container (B) when the label (L) is attached to the container (B), and which irradiates the label (L) as an object of inspection with an inspection light and receives the inspection light after irradiation to inspect the condition of the label (L), wherein a UV absorbing function or an IR absorbing function is imparted to the label (L), a UV ray- or IR ray-containing light is used as an inspection light, and an inspection light after applied to the label (L)is received for inspecting; an inspection method and an inspection device, wherein a UV fluorescent function is imparted to the label (L), a UV ray-containing light is used as an inspection light, and a reflection light after applied to the label (L) is receive for inspecting; and a method , wherein a polarizing function or a rotary polarizing function is imparted to the label (L), and an inspection light after applied to the label (L)is received for inspecting.

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Inventors:

KAMAKURA RUI (JP)
YAMAGISHI TAKAHIRO (JP)
OMURA SHIGEO (JP)

Application Number:

PCT/JP2003/007095

Publication Date:

December 18, 2003

Filing Date:

June 04, 2003

Export Citation:

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Assignee:

SUNTORY LTD (JP)
KAMAKURA RUI (JP)
YAMAGISHI TAKAHIRO (JP)
OMURA SHIGEO (JP)

International Classes:

G01B11/00; B65B57/02; G01N21/90; (IPC1-7): G01N21/90

Foreign References:

JPS60169743A	1985-09-03
JP2001027615A	2001-01-30
JPH0434348A	1992-02-05
JPH06148095A	1994-05-27
JPH0972861A	1997-03-18

Attorney, Agent or Firm:

Kitamura, Shuichiro (Kita-ku Osaka-shi, Osaka, JP)

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