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Title:
LASER BEAM PROFILE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/193491
Kind Code:
A1
Abstract:
The present invention provides a measurement device that enables high-precision measurement of a beam profile of high-powered laser. This laser beam profile measurement device comprises: a plate-like or blockish fluorescence generation element that has an incidence surface on which a laser beam is incident and an emission surface from which the laser beam is emitted; an optical separation element that separates, from the laser beam, a fluorescence which is generated inside the fluorescence generation element and emitted from the emission surface; and an image element that receives the fluorescence, wherein the plate-like or blockish fluorescence generation element has a closed slanted surface that intersects obliquely with the incidence surface and emission surface of the fluorescence generation element. The fluorescence generation element further has a support body that allows at least fluorescence to transmit therethrough, wherein it is preferable for the support body to have one surface optically joined to the emission surface. The closed slanted surface is preferably configured to constitute a lateral surface of a truncated cone or truncated pyramid, in which the incidence surface is the upper base/lower base and the emission surface is the lower base/upper base. It is also preferable for the slanted surface to be formed with grooves that are cut deep enough to exceed the thickness of the fluorescence generation element so as to reach the support body.

Inventors:
TSUNEKANE MASAKI (JP)
Application Number:
PCT/JP2017/015433
Publication Date:
October 25, 2018
Filing Date:
April 17, 2017
Export Citation:
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Assignee:
CANARE ELECTRIC CO LTD (JP)
International Classes:
G01J1/02
Foreign References:
JP2008519263A2008-06-05
JP2000213983A2000-08-04
JP2002365141A2002-12-18
JPS50115084U1975-09-19
US4885471A1989-12-05
US4916319A1990-04-10
Attorney, Agent or Firm:
KURODA, Kenji et al. (JP)
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