Title:
LASER INTERFERENCE WAVELENGTH LEVER-TYPE ABSOLUTE DISTANCE MEASUREMENT APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO/2016/154780
Kind Code:
A1
Abstract:
A laser interference wavelength lever-type absolute distance measurement apparatus, comprising a light source system (I), a wavelength lever-type laser interference system (II) and an interference signal processing and control system (III). The light source system (I) outputs orthogonal linear polarized beams of which the wavelengths are respectively λ1 and λ2, and emits same to the wavelength lever-type laser interference system (II) to form interference beams which are emitted to the interference signal processing and control system (III). In the wavelength lever-type laser interference system (II), a wavelength lever-type absolute distance measurement relationship is formed between a synthetic wavelength and a single wavelength and between a measured absolute distance and the motion displacement of a cube-corner prism (22) of a reference arm. The interference signal processing and control system (III) is responsible for detecting a phase difference between two single wavelength interference signals, calculating the measured absolute distance and controlling the change in the wavelength λ2 in the light source system (I). The apparatus can realize the measurement of any absolute distance, can realize the transition from the synthetic wavelength to the single wavelength, and is suitable for large-scale/large-sized and high-precision absolute distance measurement in the fields of large precise equipment manufacturing, spatial engineering, a measurement technique and the like. Also provided is a laser interference wavelength lever-type absolute distance measurement method.
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Inventors:
CHEN BENYONG (CN)
YAN LIPING (CN)
ZHANG SHIHUA (CN)
YAN LIPING (CN)
ZHANG SHIHUA (CN)
Application Number:
PCT/CN2015/075187
Publication Date:
October 06, 2016
Filing Date:
March 27, 2015
Export Citation:
Assignee:
UNIV ZHEJIANG SCIENCE & TECH (CN)
International Classes:
G01B11/00; G01B9/02
Foreign References:
| CN104655025A | 2015-05-27 | |||
| CN103364775A | 2013-10-23 | |||
| CN1099128A | 1995-02-22 | |||
| CN101533096A | 2009-09-16 | |||
| CN102168944A | 2011-08-31 | |||
| CN101598794A | 2009-12-09 | |||
| CN102183234A | 2011-09-14 | |||
| US5631736A | 1997-05-20 |
Attorney, Agent or Firm:
Hangzhou Qiushi Patent Office Co.,Ltd. (CN)
杭州求是专利事务所有限公司 (CN)
杭州求是专利事务所有限公司 (CN)
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