Title:
LEARNING DATA GENERATION DEVICE, LEARNING DATA GENERATION METHOD, PROGRAM, DETECTION MODEL GENERATION METHOD, AND AUTHENTICATION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/286269
Kind Code:
A1
Abstract:
In the present invention, a sample acquisition unit acquires a first sample, which is individual data pertaining to a first individual. An AX generation unit applies a perturbation to the first sample to generate an adversarial example. A feature amount acquisition unit acquires: a first feature amount, which is a feature amount of the adversarial example calculated by a learned model that calculates the feature amount by performing, on individual data that has been input, a calculation that uses a learned parameter; a second feature amount, which is a feature amount of the individual data pertaining to the first individual; and a third feature amount, which is a feature amount of individual data pertaining to a second individual different from the first individual. An output unit outputs an adversarial example which has a degree of similarity between the first feature amount and the second feature amount greater than or equal to a threshold value and a degree of similarity between the first feature amount and the third feature amount greater than or equal to a threshold value.
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Inventors:
KAKIZAKI KAZUYA (JP)
ARAKI TOSHINORI (JP)
ARAKI TOSHINORI (JP)
Application Number:
PCT/JP2021/026796
Publication Date:
January 19, 2023
Filing Date:
July 16, 2021
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06N20/00
Domestic Patent References:
| WO2020121450A1 | 2020-06-18 | |||
| WO2020143227A1 | 2020-07-16 | |||
| WO2021131029A1 | 2021-07-01 |
Attorney, Agent or Firm:
TANAI Sumio et al. (JP)
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