Title:
LEARNING DEVICE, INSPECTION DEVICE, LEARNING METHOD, AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/230356
Kind Code:
A1
Abstract:
A learning device according to the present invention is provided with a camera for capturing an image of a product sample and acquiring image data, a physical-information acquisition unit for acquiring physical information of the sample, and a computation unit for generating a learning model. The computation unit is configured so as to specify a sample category on the basis of rule information for associating the physical information and a category, associate the specified category and the image data to generate teacher data, and generate a learning model by machine learning using the teacher data. The learning model outputs the sample category in response to inputting of the image data of the sample.
Inventors:
SUGASAWA YUYA
ARAI HIDEYUKI
AIKAWA HISASHI
ARAI HIDEYUKI
AIKAWA HISASHI
Application Number:
PCT/JP2019/018946
Publication Date:
December 05, 2019
Filing Date:
May 13, 2019
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01N21/88; G01N21/27; G06T7/00; G06V10/143; G06V10/764; G06V20/00
Foreign References:
| JP2005293264A | 2005-10-20 | |||
| JP2005301823A | 2005-10-27 | |||
| JP2010071826A | 2010-04-02 | |||
| US20160110630A1 | 2016-04-21 | |||
| JP2018096834A | 2018-06-21 |
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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