Title:
LEARNING DEVICE AND LEARNING METHOD, ANOMALY DETECTION SYSTEM AND ANOMALY DETECTION METHOD, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2020/170391
Kind Code:
A1
Abstract:
The present invention enables detection of an anomaly with high accuracy even when the amount of data of time-series data measured by a sensor is scarce. Provided is a learning device comprising: an attractor creation unit that creates an attractor by embedding time-series data measured by a sensor in a high-dimensional space; and a feature extraction unit that extracts features related to variance of the time-series data embedded in the high-dimensional space from the attractor created by the attractor creation unit.
Inventors:
FUJITSUKA MASASHI (JP)
Application Number:
PCT/JP2019/006568
Publication Date:
August 27, 2020
Filing Date:
February 21, 2019
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01M99/00; G05B23/02
Foreign References:
| JP2004268122A | 2004-09-30 | |||
| KR20040070366A | 2004-08-09 | |||
| US20180173173A1 | 2018-06-21 | |||
| JP2018179986A | 2018-11-15 | |||
| US20060107954A1 | 2006-05-25 |
Other References:
YASUTOSHI NOMURA, KOICHIRO NAKATSU, HITOSHI FURUTA, TAKAYUKI KUSAKA: "Research of Baseline-less Structural Diagnosis based on Chaotic excitation", JOURNAL OF APPLIED MECHANICS, vol. 13, August 2010 (2010-08-01), pages 977 - 984, XP009523250, ISSN: 1345-9139
YASUNARI FUJIMOTO: "First steps in engineering application of chaos theory and an example introduction: introduction of chaos engineering", INTELLIGENCE AND INFORMATION, vol. 22, no. 3, 1 January 2010 (2010-01-01), pages 345 - 351, XP055734859, ISSN: 1347-7986, DOI: 10.3156/jsoft.22.3_345
YASUNARI FUJIMOTO: "First steps in engineering application of chaos theory and an example introduction: introduction of chaos engineering", INTELLIGENCE AND INFORMATION, vol. 22, no. 3, 1 January 2010 (2010-01-01), pages 345 - 351, XP055734859, ISSN: 1347-7986, DOI: 10.3156/jsoft.22.3_345
Attorney, Agent or Firm:
OKABE, Yuzuru et al. (JP)
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