Title:
LEARNING DEVICE, LEARNING METHOD, PROGRAM, AND CLASSIFICATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/079820
Kind Code:
A1
Abstract:
In order to train a machine learning model such that the inference accuracy becomes higher, a learning device (1): comprises an acquisition unit (11) for acquiring a learning image and a learning unit (12) for training a machine learning model by using the learning image; sets, as a reference positive example, a learning image belonging to a subclass different from a subclass to which an image of interest belongs, and belonging to a class same as a class to which the image of interest belongs; sets, as a negative example, a learning image belonging to a class different from a class to which the image of interest belongs; and trains the machine learning model such that the similarity between a feature amount of the image of interest and a feature amount of the reference positive example becomes greater than the similarity between the feature amount of the image of interest and a feature amount of the negative example.
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Inventors:
OMI YASUO (JP)
Application Number:
PCT/JP2022/038080
Publication Date:
April 18, 2024
Filing Date:
October 12, 2022
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06T7/00; G06V10/764
Domestic Patent References:
| WO2021161901A1 | 2021-08-19 |
Foreign References:
| JP2020181486A | 2020-11-05 | |||
| JP2021144675A | 2021-09-24 | |||
| JP2011229413A | 2011-11-17 | |||
| US20190147592A1 | 2019-05-16 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
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