LED TESTING DEVICE AND TRANSFER DEVICE

WIPO Patent Application WO/2019/172707

A1

The present invention relates to an LED testing device for testing whether a micro LED normally operates on a wafer, and to an LED transfer device for sorting out only normally operating micro LEDs by the normal operation test and transferring same. To this end, an LED testing device of the present invention comprises: two or more prober units; and a testing unit conducting electricity by making contact with an electrode of a micro LED, thereby testing whether the micro LED normally operates. In addition, the two or more prober units are arranged side by side into a plurality of matrices in horizontal and vertical directions so as to correspond to an array of micro LEDs on the wafer, and are provided in a circuit layer of a soft material. Additionally, a buffer layer made of the same material as the circuit layer is further provided on the upper surface of the circuit layer. Moreover, an LED transfer device of the present invention comprises: a pickup unit for picking up an micro LED; and a checking unit conducting electricity by making contact with an electrode of a micro LED, thereby testing whether the micro LED normally operates, wherein the pickup unit selectively picks up only micro LEDs having been checked to be operating normally by the checking unit.

PARK DU JIN (KR)
JANG PIL KUK (KR)

PCT/KR2019/002728

September 12, 2019

March 08, 2019

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NANO X (KR)

H01L33/00; H01L21/67; H01L21/677

WO2018005118A1

2018-01-04

KR20140074468A	2014-06-18
KR101532393B1	2015-07-01
US20160155892A1	2016-06-02
KR101319785B1	2013-10-18

LEE, Jin Gyu (KR)

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