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Patent Searching and Data


Title:
LENS SHAPE MEASUREMENT DEVICE, LENS SHAPE MEASUREMENT METHOD, LENS OPTICAL PROPERTY MEASUREMENT DEVICE, PROGRAM, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2020/246047
Kind Code:
A1
Abstract:
Provided is a lens shape measurement device that can measure the surface shape and the thickness of a lens with high accuracy. In a lens shape measurement device (1) according to the present invention: a lens position movement unit (16) moves a lens in an X-axis direction, so that a line laser irradiation unit (7a) irradiates a lens surface with a line laser parallel to the Y-axis direction in a state of being scanned in the X-axis direction; a line laser reception unit (7b) receives reflected light of the line laser with which the lens is irradiated; a measurement calculation unit (13) calculates surface image data on the lens from the reflected light received by the line laser reception unit (7b); the lens position movement unit (16) moves the lens in a Z-axis direction; a lens surface position detection unit (22) detects a lens surface position in the Z-axis direction; a lens reverse-surface position detection unit (23) detects a lens reverse-surface position in the Z-axis direction; and the measurement calculation unit (13) calculates thickness information on the lens on the basis of the lens surface position in the Z-axis direction, the lens reverse-surface position in the Z-axis direction, and a lens movement distance in the Z-axis direction.

Inventors:
KOIDE TAMAKI (JP)
Application Number:
PCT/JP2019/029274
Publication Date:
December 10, 2020
Filing Date:
July 25, 2019
Export Citation:
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Assignee:
REXXAM CO LTD (JP)
International Classes:
G01B11/24; G01B11/255; G01M11/00
Foreign References:
JP2005249487A2005-09-15
JP2007218931A2007-08-30
JPH08304228A1996-11-22
JP2008011878A2008-01-24
Attorney, Agent or Firm:
TSUJIMARU Koichiro et al. (JP)
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