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Patent Searching and Data


Title:
LENS SHAPE MEASUREMENT DEVICE, LENS SHAPE MEASUREMENT METHOD, LENS OPTICAL PROPERTY MEASUREMENT DEVICE, PROGRAM, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2021/038888
Kind Code:
A1
Abstract:
Provided is a lens shape measurement device that can measure the surface shape and the thickness of a lens with high accuracy. In a lens shape measurement device (1) according to the present invention, a lens position movement unit (16) moves a lens in an X-axis direction or an Xθ-axis direction and thereby causes a line laser irradiation unit (7a) to irradiate a lens surface with a line laser tilted in a Z-axis direction from a direction parallel to a Y-axis direction while said line laser is scanned in the X-axis direction or in the Xθ-axis direction, a line laser reception unit (7b) receives reflected light of the line laser with which the lens is irradiated, a measurement calculation unit (13) calculates surface image data for the lens from the reflected light received by the line laser reception unit (7b), the lens position movement unit (16) moves the lens in the Z-axis direction, a lens surface position detection unit (22) detects a lens surface position in the Z-axis direction and a lens back surface position detection unit (23) detects a lens back surface position in the Z-axis direction, and the measurement calculation unit (13) calculates thickness information for the lens from the lens surface position in the Z-axis direction, the lens back surface position in the Z-axis direction, and the movement distance of the lens in the Z-axis direction.

Inventors:
KOIDE TAMAKI (JP)
Application Number:
PCT/JP2019/034308
Publication Date:
March 04, 2021
Filing Date:
August 30, 2019
Export Citation:
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Assignee:
REXXAM CO LTD (JP)
International Classes:
G01B11/24; G01B11/06; G01M11/00; G01M11/02; G02C7/02; G02C13/00
Foreign References:
JP6564545B12019-08-21
Attorney, Agent or Firm:
TSUJIMARU Koichiro et al. (JP)
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