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Patent Searching and Data


Title:
LEVEL MEASUREMENT METHOD AND LEVEL MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/124377
Kind Code:
A1
Abstract:
Provided are a level measurement method and a level measurement device which are capable of measuring, by using microwaves, a slag surface during blowing more accurately than before. The level measurement device 10 removes a level measurement value determined as a noise (SP9), and specifies the level of a slag surface 3 in a furnace on the basis of only a level measurement value remaining without being removed (SP8). Accordingly, in the level measurement device 10, the specifying of a level of the slag surface 3 in the furnace on the basis of an erroneous level measurement value generated by bare metal can be suppressed. Thus, the slag surface 3 during blowing can be measured more accurately than before.

Inventors:
KINOSHITA TAKAHIRO (JP)
SUGIHASHI ATSUSHI (JP)
Application Number:
PCT/JP2018/046573
Publication Date:
June 27, 2019
Filing Date:
December 18, 2018
Export Citation:
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Assignee:
NIPPON STEEL CORP (JP)
International Classes:
C21C5/46; F27D21/00; G01F23/284
Foreign References:
JP2016029206A2016-03-03
JP2017142104A2017-08-17
JP2011043343A2011-03-03
Attorney, Agent or Firm:
DORAIT IP LAW FIRM (JP)
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