Title:
LIGHT DETECTION ELEMENT AND LIGHT DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/079897
Kind Code:
A1
Abstract:
This light detection element includes: a semiconductor substrate; a first conductive type light absorption layer formed on the semiconductor substrate; a first conductive type cap layer formed on the light absorption layer; and a second conductive type semiconductor area which is formed in the cap layer and forms a pn junction with the cap layer. A depletion layer formed around the semiconductor area does not reach the light absorption layer, when a reverse bias is not applied to the pn junction, and exceeds a position at 50% of the thickness of the light absorption layer from a cap layer side, when the reverse bias of 20 V is applied to the pn junction.
Inventors:
MASE MITSUHITO (JP)
TAGUCHI KEIKI (JP)
ISHIHARA HAJIME (JP)
YAMAMOTO HIROO (JP)
SHIMADA AKIHIRO (JP)
TAGUCHI KEIKI (JP)
ISHIHARA HAJIME (JP)
YAMAMOTO HIROO (JP)
SHIMADA AKIHIRO (JP)
Application Number:
PCT/JP2019/027418
Publication Date:
April 23, 2020
Filing Date:
July 10, 2019
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
H01L31/10; G01S17/08
Foreign References:
US20070034898A1 | 2007-02-15 | |||
JP2002231992A | 2002-08-16 | |||
JP2007311720A | 2007-11-29 | |||
JPH03230582A | 1991-10-14 | |||
JPS631079A | 1988-01-06 | |||
JP2004241588A | 2004-08-26 | |||
JP2013224931A | 2013-10-31 | |||
JP2014077658A | 2014-05-01 | |||
JP2011133464A | 2011-07-07 |
Other References:
See also references of EP 3869570A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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