Title:
LIGHT INTENSITY MEASURING METHOD AND LIGHT INTENSITY MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2007/013551
Kind Code:
A1
Abstract:
There is provided a light intensity measuring method for acquiring an image of a detection object in which a plurality of detection object regions each having a predetermined area are arranged, analyzing the acquired image, and measuring the light intensity of each detection object region. Among the regions extracted according to the light intensity from the acquired image, a region having a smaller area than the predetermined area of the detection object region is extracted as a noise region and removed from the image. The light intensity measuring device includes: light irradiation means for applying light to the detection object; image acquisition means for acquiring an image of the object to which the light has been applied; storage means for storing the acquired image; extraction means for extracting a region having a smaller area than the predetermined area of the detection object region from the stored image as a noise region; and image processing means for removing the noise region from the stored image.
Inventors:
OKAWA KANEYASU (JP)
SAIDA YUKO (JP)
SHIBAZAKI TAKAMI (JP)
SAIDA YUKO (JP)
SHIBAZAKI TAKAMI (JP)
Application Number:
PCT/JP2006/314870
Publication Date:
February 01, 2007
Filing Date:
July 27, 2006
Export Citation:
Assignee:
OLYMPUS CORP (JP)
OKAWA KANEYASU (JP)
SAIDA YUKO (JP)
SHIBAZAKI TAKAMI (JP)
OKAWA KANEYASU (JP)
SAIDA YUKO (JP)
SHIBAZAKI TAKAMI (JP)
International Classes:
G01N21/64; G01N21/76
Foreign References:
| JP2005345339A | 2005-12-15 | |||
| JP2002350350A | 2002-12-04 | |||
| JP2004163201A | 2004-06-10 | |||
| JP2003504627A | 2003-02-04 | |||
| JP2002257730A | 2002-09-11 | |||
| JPH0694595A | 1994-04-05 |
Attorney, Agent or Firm:
TANAI, Sumio et al. (Yaesu Chuo-k, Tokyo 53, JP)
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