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Patent Searching and Data


Title:
LIGHT SOURCE LUMINANCE DECAY TESTING DEVICE AND A PROJECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2019/019591
Kind Code:
A1
Abstract:
A light source luminance decay testing device comprises: a mounting base (400), a luminance tester (300), a light extraction reflector (210) provided at the lower end of the mounting base (400), and a relay assembly; the relay assembly comprises at least one relay lens (220), and is provided in the mounting base (400). A projection apparatus comprises: a projection light source (500) and a projection light passage (600); the projection light passage (600) is provided with an opening; the lower part of the light source luminance testing device can be inserted from the opening of the projection light passage (600) together with the light extract reflector (210). After light from the light source enters the projection light passage (600), a part of light to be tested is extracted by means of the light extraction reflector (210), and a part of the light to be tested is guided to a test probe (310) of the luminance tester (300) by means of the relay assembly. The light source luminance decay testing device can be applied to an existing projection apparatus, can accurately feed back the decay of the light source during use, facilitates test operations, and can test light source luminance separately without impact on the normal use of the projection apparatus.

Inventors:
DU LUNCHUN (CN)
HOU HAIXIONG (CN)
LI YI (CN)
Application Number:
PCT/CN2018/074755
Publication Date:
January 31, 2019
Filing Date:
January 31, 2018
Export Citation:
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Assignee:
APPOTRONICS CORP LTD (CN)
International Classes:
G01M11/02; G01J1/04
Foreign References:
CN102147288A2011-08-10
CN202255836U2012-05-30
CN201352150Y2009-11-25
CN106017869A2016-10-12
CN202195881U2012-04-18
JPS6287818A1987-04-22
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