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Title:
LIGHT WAVELENGTH MEASUREMENT APPARATUS AND METHOD, AND LIGHT WAVELENGTH CONTROL DEVICE AND LIGHT-EMITTING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/070378
Kind Code:
A1
Abstract:
A light wavelength measurement apparatus and method, and a light wavelength control device and a light-emitting system. The light wavelength measurement apparatus and method can be used for expanding a wavelength range which can be detected by means of light wavelength measurement technology, and the light wavelength control device and the light-emitting system can be used for providing a laser having a stable wavelength. By means of the measurement apparatus, light to be measured can be respectively superimposed on a light component corresponding to each comb frequency value among a plurality of comb frequency values in an optical frequency comb, such that a combined wave corresponding to each light component can be obtained; and a measured value of the wavelength of said light is then determined according to an electrical signal, which is obtained by means of an electrical beat frequency, of a combined wave corresponding to a target light component, wherein the electrical signal corresponding to the target light component comprises a beat frequency signal.

Inventors:
ZHOU LEI (CN)
Application Number:
PCT/CN2021/126758
Publication Date:
May 04, 2023
Filing Date:
October 27, 2021
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G01J9/00
Foreign References:
CN107024285A2017-08-08
CN110567594A2019-12-13
CN111609999A2020-09-01
US20160011055A12016-01-14
JP2013072848A2013-04-22
CN107240854A2017-10-10
Attorney, Agent or Firm:
SHENPAT INTELLECTUAL PROPERTY AGENCY (CN)
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