Title:
LIGHT WAVELENGTH MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/056208
Kind Code:
A1
Abstract:
This light wavelength measurement device is provided with a high-frequency voltage generating circuit (50) for causing an acousto-optic tunable filter (12) to vibrate by applying a high-frequency signal to the same, a standard wavelength generator (13), a light wavelength changing sensor (20), an input unit (140) for applying the output light output by the acousto-optic tunable filter (12) to the standard wavelength generator (13) and light wavelength changing sensor (20), a measurement light receiver (30) for receiving the output light output from the standard wavelength generator (13) and the output light output by the light wavelength changing sensor (20), a calculation circuit (60) for calculating the wavelength of the light wavelength changing sensor (20) on the basis of the signal output by the measurement light receiver (30), a filter temperature detection unit (91) for detecting the temperature of the acousto-optic tunable filter (12), and a control unit (40) for controlling the frequency signal output to the acousto-optic tunable filter (12) on the basis of the temperature signal from the filter temperature detection unit (91).
Inventors:
FUJITA KEIICHI (JP)
OJIMA YOU (JP)
OHI NAOYUKI (JP)
KAWAKAMI NAOSHI (JP)
KOBAYASHI HIROKI (JP)
OGAWA KEN (JP)
OJIMA YOU (JP)
OHI NAOYUKI (JP)
KAWAKAMI NAOSHI (JP)
KOBAYASHI HIROKI (JP)
OGAWA KEN (JP)
Application Number:
PCT/JP2017/033445
Publication Date:
March 29, 2018
Filing Date:
September 15, 2017
Export Citation:
Assignee:
NAGANO KEIKI CO LTD (JP)
International Classes:
G01J9/00; G01J3/12
Domestic Patent References:
| WO2009054193A1 | 2009-04-30 | |||
| WO2007083609A1 | 2007-07-26 |
Foreign References:
| JPH1038690A | 1998-02-13 | |||
| JP2002368317A | 2002-12-20 | |||
| JP2001511895A | 2001-08-14 | |||
| US6624889B1 | 2003-09-23 |
Attorney, Agent or Firm:
KINOSHITA & ASSOCIATES (JP)
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