Title:
LIQUID CRYSTAL ARRAY INSPECTION DEVICE AND LIQUID CRYSTAL ARRAY INSPECTION DEVICE SIGNAL PROCESSING METHOD
Document Type and Number:
WIPO Patent Application WO/2010/079607
Kind Code:
A1
Abstract:
A normal value calculation is performed for each pixel as follows in order to reduce the affect from a defect intensity of a pixel in the vicinity. When the detection intensity is within a level range which can be assumed on a panel, the detection intensity of a pixel in the vicinity is used to calculate the normal value of a target pixel. On the other hand, when the detection intensity is out of the level range which can be assumed on the panel, the normal value set for an adjacent pixel is set as the normal value of a target pixel without calculating the normal value of the target pixel so as to avoid the affect from the defect intensity of the pixels in the vicinity. The panel standard deviation is used to judge whether the detection intensity is within the assumed level range. This suppresses variations caused by fluctuations contained in the detection intensity when calculating a normal value for deciding gradation and reduces the affect of the defect intensity of adjacent pixels to the normal value, thereby calculating an appropriate normal value from the detection intensity.
Inventors:
NAGAI, Masamichi (1 Nishinokyo-Kuwabaracho, Nakagyo-k, Kyoto-shi Kyoto 11, 60485, JP)
Application Number:
JP2009/050199
Publication Date:
July 15, 2010
Filing Date:
January 09, 2009
Export Citation:
Assignee:
SHIMADZU CORPORATION (1 Nishinokyo-Kuwabaracho, Nakagyo-ku Kyoto-shi Kyoto, 11, 60485, JP)
株式会社島津製作所 (〒11 京都府京都市中京区西ノ京桑原町１番地 Kyoto, 60485, JP)
株式会社島津製作所 (〒11 京都府京都市中京区西ノ京桑原町１番地 Kyoto, 60485, JP)
International Classes:
G01N23/225; G01M11/00; G01R31/00; G09F9/00
Attorney, Agent or Firm:
SHIONOIRI, Akio (Fujisawa-Central Bldg. 6F, 1-4 Kugenuma-Tachibana 1-chome, Fujisawa-sh, Kanagawa 24, 25100, JP)
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