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Title:
LIQUID CRYSTAL DEVICE, METHOD FOR MEASURING RESIDUAL DC VOLTAGE IN LIQUID CRYSTAL DEVICE, METHOD FOR DRIVING LIQUID CRYSTAL DEVICE, AND METHOD FOR MANUFACTURING LIQUID CRYSTAL DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/101089
Kind Code:
A1
Abstract:
The present invention provides a method for measuring a residual DC voltage in a liquid crystal device, the liquid crystal device comprising an active region (R1) including a plurality of liquid crystal capacitors and a plurality of thin film transistors (TFT) and an inactive region (R2) located in a region excluding the active region and having at least one monitor capacitor (MVr1), with the plurality of liquid crystal capacitors and the at least one monitor capacitor including a liquid crystal layer. The method for measuring a residual DC voltage in a liquid crystal device comprises: a step of creating a V-I curve by measuring a current flowing in one electrode in a pair of electrodes included in the at least one monitor capacitor while applying a positive-negative symmetrical triangular wave voltage to the other electrode; a step of measuring a voltage Vmax having a maximum absolute value where a current reaches a positive local maximum value or local minimum value in the V-I curve, and a voltage Vmin having a maximum absolute value where a current reaches a negative local minimum value or local maximum value; and a step of measuring one-half of the sum of the Vmax and Vmin as the residual DC voltage.

Inventors:
MIZUSAKI MASANOBU
Application Number:
PCT/JP2017/041529
Publication Date:
June 07, 2018
Filing Date:
November 17, 2017
Export Citation:
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Assignee:
SHARP KK (JP)
International Classes:
G02F1/13; G02F1/1368; H01L21/336; H01L29/786; H01Q3/34; H01Q3/44; H01Q13/22; H01Q21/06
Domestic Patent References:
WO2007141935A12007-12-13
Foreign References:
JP2006133379A2006-05-25
US20160261042A12016-09-08
Other References:
ZHANG, SHIYONG ET AL.: "P-68: Electrical Measurements of Charge Migrations In Liquid Crystal displays", 2001 SID INTERNATIONAL SYMPOSIUM, 3 June 2001 (2001-06-03), pages 810 - 813, XP007007868
Attorney, Agent or Firm:
OKUDA Seiji (JP)
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