Title:
LOG ANALYSIS SYSTEM, LOG ANALYSIS METHOD AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2019/202711
Kind Code:
A1
Abstract:
Provided are a log analysis system, a log analysis method and a recording medium which can generate information indicating a condition of a system without requiring a human to define the condition of a target system beforehand. The log analysis system comprises: a characteristic extraction unit which extracts a characteristic of a text log file comprising a plurality of text log messages that are information in which an event in the target system and a time when said event occurred are associated; and an index generation unit which generates an index indicating the condition of the target system on the basis of the characteristic and of numerical data comprising numerical information relating to the target system and the time said numerical information was recorded.
Inventors:
TOGAWA RYOSUKE (JP)
Application Number:
PCT/JP2018/016189
Publication Date:
October 24, 2019
Filing Date:
April 19, 2018
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06F11/34
Domestic Patent References:
| WO2017154844A1 | 2017-09-14 | |||
| WO2015072085A1 | 2015-05-21 | |||
| WO2017037801A1 | 2017-03-09 |
Foreign References:
| US20170277997A1 | 2017-09-28 |
Other References:
TOGAWA RYOSUKE: "A log analysis method using sequential log patterns for large scale systems", IEEE TECHNICAL REPORT, vol. 114, no. 390, 8 January 2015 (2015-01-08), pages 1 - 2, XP055645604
Attorney, Agent or Firm:
OKABE, Yuzuru et al. (JP)
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