Title:
LOW-DENSITY PARITY-CHECK CODES FOR MULTIPLE CODE RATES
Document Type and Number:
WIPO Patent Application WO2004114526
Kind Code:
A3
Abstract:
Puncture sequences S1, S2, etc. for code rates R1, R2, etc. less than a maximum code rate Rmax are defined subsets of a maximum rate puncture sequence Smax that corresponds to the maximum code rate Rmax. Each puncture sequence Si for a code rate Ri is related to the puncture sequence Si-1 of the previous code rate Ri-1 and preferably S1?S2?S3? ...?Smax-1?Smax. The puncture sequences are groups of one or more memory elements, each of which is a variable degree, a variable node location, a check degree, or a check node location. A method for deriving such a puncture sequence for variable code rates is also disclosed.
Inventors:
STOLPMAN VICTOR J (US)
Application Number:
PCT/IB2004/001886
Publication Date:
June 29, 2006
Filing Date:
June 09, 2004
Export Citation:
Assignee:
NOKIA CORP (FI)
NOKIA INC (US)
STOLPMAN VICTOR J (US)
NOKIA INC (US)
STOLPMAN VICTOR J (US)
International Classes:
H03M13/00; H03M13/11; H04L1/00; H03M; (IPC1-7): H03M13/11; H03M13/35
Foreign References:
| US6633856B2 | 2003-10-14 | |||
| US20020101915A1 | 2002-08-01 |
Other References:
COX ET AL.: "Subband Speech Coding and Matched Convolutional Channel Coding for Mobile Radio Channels.", IEEE TRANSACTIONS ON SIGNAL PROCESSING., vol. 39, no. 8, August 1991 (1991-08-01), pages 1717 - 1731, XP000260894
KIM ET AL.: "Rate Compatible Punctured SCCC.", IEEE 54TH VEHICULAR TECHNOLOGY CONFERENCE., October 2001 (2001-10-01), pages 2399 - 2403, XP010562401
KIM ET AL.: "Rate Compatible Punctured SCCC.", IEEE 54TH VEHICULAR TECHNOLOGY CONFERENCE., October 2001 (2001-10-01), pages 2399 - 2403, XP010562401
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