Title:
LOW INSERTION FORCE CONNECTOR ASSEMBLY AND SEMICONDUCTOR COMPONENT TEST APPARATUS
Document Type and Number:
WIPO Patent Application WO/2018/190633
Kind Code:
A1
Abstract:
A low insertion force connector assembly according to the present invention comprises a first connector and a second connector which are detachably coupled to each other, wherein the first connector and the second connector are easily assembled to prevent contact failure and are firmly assembled to each other to improve dimensional stability, and it is easy to assemble and manufacture the connectors. A semiconductor component test apparatus comprises: a plate-like substrate having a plurality of substrate fixing pin holes; a plurality of connecting components which have a plurality of contact pins arranged in a plurality of rows and which are coupled to the substrate by means of fixing pins and coupling members; and a plurality of connectors which have a plurality of connector pins arranged in a plurality of rows and which are detachably coupled to the connecting components. The connecting components comprise a connecting component main body, the contact pins are spaced apart from each other on the connecting component main body and arranged in a plurality of rows, and a plurality of main body fixing pin holes are formed in the connecting component main body along the longitudinal direction thereof. The coupling members and the connecting components are located on two sides with the substrate therebetween; the heads of the fixing pins are caught by the main body fixing pin holes and pass through the main body fixing pin holes and the substrate fixing pin holes successively; and the end portions of the fixing pins are caught by pin catching parts of the coupling members, and therefore the connection components are coupled to the substrate.
Inventors:
PARK JOONEON (KR)
AN SANGIL (KR)
AN SANGIL (KR)
Application Number:
PCT/KR2018/004243
Publication Date:
October 18, 2018
Filing Date:
April 11, 2018
Export Citation:
Assignee:
KEMITEC INC (KR)
International Classes:
G01R1/04; G01R1/073; G01R31/28; H01R12/82; H01R12/83; H01R13/62; H01R13/639; H01R13/64
Foreign References:
| KR20090133102A | 2009-12-31 | |||
| KR20020042494A | 2002-06-05 | |||
| KR100490608B1 | 2005-05-17 | |||
| JP2006214732A | 2006-08-17 | |||
| JP4860242B2 | 2012-01-25 |
Attorney, Agent or Firm:
PATENT LAW FIRM GRAND KOREA (KR)
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