Title:
MACHINE LEARNING BASED MMW BEAM MEASUREMENT
Document Type and Number:
WIPO Patent Application WO/2024/020993
Kind Code:
A1
Abstract:
A UE may measure metrics of a first subset of PO beams of at least one subset of PO beams including a plurality of PO beams from a network node, each subset of PO beams configured to form a PO pattern and the first subset of PO beams being associated with a first set of narrower RX beams of the UE, estimate metrics of the first set of narrower Rx beams using a ML model based on the metrics of the subset of PO beams, and identify at least one best Rx beam from the first set of narrower Rx beams, the at least one best Rx beam being associated with best estimated metrics among the first set of narrower Rx beams.
Inventors:
LIU JIAHENG (US)
CHIN TOM (US)
LI ZHONGSHENG (US)
CHIN TOM (US)
LI ZHONGSHENG (US)
Application Number:
PCT/CN2022/108868
Publication Date:
February 01, 2024
Filing Date:
July 29, 2022
Export Citation:
Assignee:
QUALCOMM INC (US)
LIU JIAHENG (CN)
CHIN TOM (US)
LI ZHONGSHENG (CN)
LIU JIAHENG (CN)
CHIN TOM (US)
LI ZHONGSHENG (CN)
International Classes:
H04B7/08; H04B7/06
Foreign References:
| US20150341105A1 | 2015-11-26 | |||
| US20220077913A1 | 2022-03-10 | |||
| CN113242071A | 2021-08-10 | |||
| US20180212653A1 | 2018-07-26 |
Attorney, Agent or Firm:
NTD PATENT & TRADEMARK AGENCY LTD. (CN)
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