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Patent Searching and Data


Title:
MACROMOLECULE MEASUREMENT METHOD BY X-RAY DIFFRACTION
Document Type and Number:
WIPO Patent Application WO/2022/239875
Kind Code:
A1
Abstract:
Provided are an analysis device and an analysis method with which it is possible to measure movement of macromolecules on a surface (interface) and obtain information regarding the vicinity of a surface being observed without labelling by observing macromolecules in a state in which X-ray is totally reflected. The present invention provides: an analysis device capable of radiating X-rays at macromolecules at an incidence angle in the vicinity of the critical angle and acquiring time-division diffraction/scattering images; and a method for analyzing macromolecules having a step for radiating X-rays at a macromolecule sample at an incidence angle in the vicinity of the critical angle, and a step for acquiring time-division diffraction/scattering images and evaluating the kinetic property of the macromolecule surface/interface.

Inventors:
INAMASU RENA (JP)
YAMAGUCHI HIROKI (JP)
SASAKI YUUJI (JP)
MIO KAZUHIRO (JP)
Application Number:
PCT/JP2022/020302
Publication Date:
November 17, 2022
Filing Date:
May 10, 2022
Export Citation:
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Assignee:
DAIKIN IND LTD (JP)
AIST (JP)
International Classes:
G01N23/205
Foreign References:
JP2014052223A2014-03-20
JP2018084447A2018-05-31
JPH0854358A1996-02-27
JPH10332607A1998-12-18
Other References:
SASAKI, YUJI: "Development of x-ray single molecule tracking method and its wide area applications", ELECTROCHEMISTRY, THE ELECTROCHEMICAL SOCIETY OF JAPAN, vol. 88, no. 3, 5 September 2020 (2020-09-05), pages 246 - 253, XP009541112, ISSN: 2433-3255, DOI: 10.5796/denkikagaku.20-FE0025
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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