MAGNETIC IMPEDANCE MEASURING DEVICE

WIPO Patent Application WO/2006/109382

A1

An AC magnetic field of low frequency is applied to a measurement object and distribution of induced current is measured to detect distribution of the impedance characteristic of the measurement object. A magnetic impedance measuring device includes: an application coil for generating an AC magnetic field whose frequency can be varied and a power source for the application coil; at least a pair of magnetic sensor means formed by two magnetic sensors for detecting a vector component parallel to the application coil surface by a vector component orthogonal to the magnetic field generated by the measurement object; magnetic sensor measuring means arranged apart from the application coil surface to oppose to the measurement object for measuring a detection signal of the magnetic sensor means; a lock-in amplifier circuit for detecting a signal of the same frequency as the application coil from the output of the magnetic sensor measuring means; and analysis means for analyzing the output intensity and the phase change of the magnetic sensor by the output signal of the lock-in amplifier circuit.

TSUKADA KEIJI (JP)
KIWA TOSHIHIKO (JP)

PCT/JP2006/304927

October 19, 2006

March 13, 2006

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UNIV OKAYAMA NAT UNIV CORP (JP)
TSUKADA KEIJI (JP)
KIWA TOSHIHIKO (JP)

G01N27/72; G01N27/82; G01R31/302; G01R33/02

JP2003222664A	2003-08-08
JPS4610362B1
JPH07311251A	1995-11-28
JPH09178710A	1997-07-11
JPH05203629A	1993-08-10
JP2003004831A	2003-01-08
JP2001013231A	2001-01-19

Sugimura, Kosaku (2-4 Kasumigaseki 3-chome, Chiyoda-k, Tokyo 13, JP)

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