Title:
MAGNETIC MEASURING DEVICE, MAGNETIC MEASURING UNIT, MAGNETIC MEASURING SYSTEM, AND MAGNETIC MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2016/125780
Kind Code:
A1
Abstract:
Provided is a magnetic measuring device in which the influence of a magnetic field generated by a sense current is reduced. A magnetic measuring device (10) is provided with: magnetic resistance elements (1); upper wiring layers (2) that face magnetization free layers (7); and lower wiring layers (3) that face magnetization fixed layers (6), wherein upper inter-layer wires (4) are vertically provided between the upper wiring layers (2) and the magnetization free layers (7); and lower inter-layer wires (5) are vertically provided between the lower wiring layers (3) and the magnetization fixed layers (6).
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Inventors:
SHIOTA MASAHIRO
Application Number:
PCT/JP2016/053033
Publication Date:
August 11, 2016
Filing Date:
February 02, 2016
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
G01R33/09; G01R33/025; H01L21/28; H01L21/3205; H01L21/768; H01L23/522; H01L29/41; H01L43/08
Domestic Patent References:
| WO2006109382A1 | 2006-10-19 |
Foreign References:
| JP2002314168A | 2002-10-25 | |||
| JP2015014520A | 2015-01-22 | |||
| JP2003004828A | 2003-01-08 | |||
| JP2002270920A | 2002-09-20 | |||
| JP2002109708A | 2002-04-12 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
Patent business corporation HARAKENZO WORLD PATENT & TRADEMARK (JP)
Patent business corporation HARAKENZO WORLD PATENT & TRADEMARK (JP)
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