Title:
MAGNETIZATION ANALYSIS METHOD, MAGNETIZATION ANALYSIS DEVICE, AND COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO/2008/053921
Kind Code:
A1
Abstract:
It is possible to perform accurate magnetization analysis by considering the magnetic
state of an incomplete magnetic region. A magnetization analysis device performs
magnetization analysis by using a magnetizer parameter associated with a magnetizer
and a magnet parameter associated with a magnet material so as to calculate a magnetization
magnetic field applied to respective portions of the magnet material (S17),
calculates a recoil ratio permeability and a coercive force as region parameters
associated with an incompletely magnetized region of a permanent magnet as an
analysis object for the respective portions according to the calculation result
of the magnetized magnetic field and the demagnetization curve associated with
the incompletely magnetized region actually measured in advance (S18), and
performs a magnetic field analysis by using the calculation result of the region
parameter so as to calculate a state parameter indicating the magnetized state
of the permanent magnet as an analysis object (S19).
Inventors:
SHIMAMURA, Hidenari (())
島村 秀成 (())
島村 秀成 (())
Application Number:
JP2007/071232
Publication Date:
May 08, 2008
Filing Date:
October 31, 2007
Export Citation:
Assignee:
HITACHI METALS, LTD. (2-1 Shibaura 1-chome, Minato-ku Tokyo, 14, 1058614, JP)
日立金属株式会社 (〒14 東京都港区芝浦１丁目２番１号 Tokyo, 1058614, JP)
SHIMAMURA, Hidenari (())
日立金属株式会社 (〒14 東京都港区芝浦１丁目２番１号 Tokyo, 1058614, JP)
SHIMAMURA, Hidenari (())
International Classes:
G01R33/12; G06F17/50; H01F13/00
Attorney, Agent or Firm:
KOHNO, Takao (KOHNO PATENT OFFICE, 4-3 Tsuriganecho 2-chome,Chuo-ku, Osaka-sh, Osaka 35, 5400035, JP)
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