MAINTENANCE EXPERT SYSTEM FOR MEASURING INSTRUMENT

WIPO Patent Application WO/2011/043450

A1

A measuring instrument for measuring an object to be measured is configured by a CPU (9) which is provided with a plurality of internal timer counters and has a function of calculating the measurement value of the object to be measured on the basis of detection values from various sensors, a power supply circuit (3) which supplies power to the CPU (9), a detector (4) which detects the state of the object to be measured, a display unit (5) which displays detection input data from the various sensors and the state of the object to be measured that is obtained by the calculation, a real-time clock IC (RTC) (11) which measures the elapsed time, an EEPROM (12) which stores data inputted to the CPU (9), and an FeRAM (13) which stores input values from the various sensors and stores a calculation result calculated by the CPU (9) on the basis of the input values from the various sensors.

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SAITOH, Shunji (10-8 Kamiochiai 3-chome, Shinjuku-k, Tokyo 08, 〒1618508, JP)
斉藤　俊二 (〒08 東京都新宿区上落合３丁目１０番８号　株式会社オーバル内 Tokyo, 〒1618508, JP)

JP2010/067711

April 14, 2011

October 04, 2010

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OVAL CORPORATION (10-8, Kamiochiai 3-chome Shinjuku-k, Tokyo 08, 〒1618508, JP)
株式会社オーバル (〒08 東京都新宿区上落合３丁目１０番８号 Tokyo, 〒1618508, JP)
SAITOH, Shunji (10-8 Kamiochiai 3-chome, Shinjuku-k, Tokyo 08, 〒1618508, JP)

G01D9/00; G01D21/00; G01F1/84; G01K1/14; G06Q50/00

KOBAYASHI, Tamotsu (4th Floor, Libra Iwamoto-cho 3-1-9, Iwamoto-cho, Chiyoda-k, Tokyo 32, 〒1010032, JP)

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