Title:
MALFUNCTION DETECTION DEVICE, LIGHT EMISSION DRIVING DEVICE, AND LIGHT EMISSION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/183935
Kind Code:
A1
Abstract:
In order to detect malfunctions in a light emission driving unit (110) for driving a light emitting element (20) in a light emission driving device (10), a malfunction detection device (100) is provided to the light emission driving device (10) comprising the light emission driving unit (110), which supplies a light emission current for causing the light emitting element (20) to emit light during a light emission period during which the light emitting element (20) is caused to emit light. The malfunction detection device (100) provided to the light emission driving device (10) detects malfunctions in the light emission driving unit (110) on the basis of the voltage of an output terminal (113), which is a terminal that supplies the light emission current in the light emission driving unit (110) that supplies the light emission current for causing the light emitting element (20) to emit light during the light emission period.
Inventors:
SHOUBU HIROYUKI (JP)
KAMIZURU HAYATO (JP)
KAMIZURU HAYATO (JP)
Application Number:
PCT/JP2020/002475
Publication Date:
September 17, 2020
Filing Date:
January 24, 2020
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H05B45/00; H01L33/00; H01S5/042; H05B47/20
Domestic Patent References:
| WO2011040512A1 | 2011-04-07 | |||
| WO2019039312A1 | 2019-02-28 |
Foreign References:
| JP2013131348A | 2013-07-04 | |||
| JP2011198971A | 2011-10-06 | |||
| JP2011035134A | 2011-02-17 | |||
| JP2017016919A | 2017-01-19 | |||
| US20070171947A1 | 2007-07-26 |
Attorney, Agent or Firm:
MATSUO Kenichiro (JP)
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