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Patent Searching and Data


Title:
MALFUNCTION DETECTION/DIAGNOSTIC METHOD, AND MALFUNCTION DETECTION/DIAGNOSTIC SYSTEM
Document Type and Number:
WIPO Patent Application WO/2013/024613
Kind Code:
A1
Abstract:
Provided are a malfunction detection/diagnostic method and system whereby it is possible, in equipment such as a plant, to detect malfunctions promptly and with high sensitivity, wherein malfunction detection is carried out using operating information such as the operating time of the equipment and output signals from a plurality of sensors appended to the equipment, and wherein maintenance logs, such as written procedure reports comprising procedure logs and instances of past countermeasures such as replacement part information, are targeted to make associations between detected malfunctions and countermeasures, and create links between malfunction detection and past maintenance logs, making reference to equipment records as well, while classifying and presenting malfunctions that require action, thereby improving diagnostic accuracy.

Inventors:
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
Application Number:
PCT/JP2012/063879
Publication Date:
February 21, 2013
Filing Date:
May 30, 2012
Export Citation:
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Assignee:
HITACHI LTD (JP)
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
International Classes:
G05B23/02
Foreign References:
JP2011059790A2011-03-24
JP2011145846A2011-07-28
JPH07253812A1995-10-03
JPH11175134A1999-07-02
JP2009110066A2009-05-21
JP2003295939A2003-10-17
Attorney, Agent or Firm:
POLAIRE I. P. C. (JP)
Polaire Intellectual Property Corporation (JP)
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Claims: