Title:
MALFUNCTION PROBABILITY EVALUATION SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2019/176315
Kind Code:
A1
Abstract:
An objective of the present invention is to more precisely forecast remaining lifespans of components of a mechanical system. Provided is a malfunction probability evaluation system for evaluating malfunctions of components in each of a plurality of mechanical systems forming together a mechanical system group, said malfunction probability evaluation system characterized by comprising a malfunction history database for accumulating past malfunction history data for a mechanical system, a time-series operation database for storing time-series physical quantity data representing operation states of the mechanical system, a malfunction rate function identification part for computing a malfunction rate function of the mechanical system by a statistical process based on the malfunction history data, and a damage model generation/update part having a function for, using the time-series physical quantity data, generating an explanatory variable formula for the malfunction rate function whereby variations in the lifespans defined by the malfunction rate function become minimized, said malfunction probability evaluation system also being characterized in that the malfunction rate function identification part provides the malfunction rate function whereby variations in the lifespans are minimized.
Inventors:
UEKI YOSUKE (JP)
Application Number:
PCT/JP2019/002230
Publication Date:
September 19, 2019
Filing Date:
January 24, 2019
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G06Q10/04; G01M99/00; G06Q10/00
Domestic Patent References:
| WO2017163561A1 | 2017-09-28 |
Foreign References:
| JP2009217718A | 2009-09-24 | |||
| JP2007107446A | 2007-04-26 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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