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Patent Searching and Data


Title:
MANAGEMENT SYSTEM AND MANAGEMENT METHOD FOR COMPUTER SYSTEM
Document Type and Number:
WIPO Patent Application WO/2012/008058
Kind Code:
A1
Abstract:
Provided is a failure analysis function capable of reducing the time needed to resolve a failure in a monitored apparatus. Upon detection of the status normalization of an apparatus in an abnormal status during failure analysis processing, the failure analysis results which resolved the apparatus abnormal state which was the basis of derivation are displayed on a GUI distinguished from the other analysis results. When the failure analysis results are derived from a plurality of failure events, the results are displayed on the GUI distinguished from the other failure analysis results at the point in time when the normalization of all the failure events has been confirmed (see fig. 16).

Inventors:
NAGAI Takayuki (Systems Development Laboratory, 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
永井 崇之 (〒17 神奈川県横浜市戸塚区吉田町292番地 株式会社日立製作所 システム開発研究所内 Kanagawa, 〒2440817, JP)
KUNII Masashi (Systems Development Laboratory, 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
國井 雅 (〒17 神奈川県横浜市戸塚区吉田町292番地 株式会社日立製作所 システム開発研究所内 Kanagawa, 〒2440817, JP)
Application Number:
JP2010/062696
Publication Date:
January 19, 2012
Filing Date:
July 28, 2010
Export Citation:
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Assignee:
HITACHI, LTD. (6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo, 80, 〒1008280, JP)
株式会社日立製作所 (〒80 東京都千代田区丸の内一丁目6番6号 Tokyo, 〒1008280, JP)
NAGAI Takayuki (Systems Development Laboratory, 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
永井 崇之 (〒17 神奈川県横浜市戸塚区吉田町292番地 株式会社日立製作所 システム開発研究所内 Kanagawa, 〒2440817, JP)
KUNII Masashi (Systems Development Laboratory, 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
International Classes:
G06F11/34
Attorney, Agent or Firm:
HIRAKI Yusuke et al. (Kamiya-cho MT Bldg. 19F, 3-20 Toranomon 4-chome, Minato-k, Tokyo 01, 〒1050001, JP)
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Claims: