Title:
MARK ARRANGEMENT MEASURING METHOD, POSITIONAL POSTURE ESTIMATING METHOD, MARK ARRANGEMENT MEASURING APPARATUS AND POSITIONAL POSTURE ESTIMATING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2006/082825
Kind Code:
A1
Abstract:
To measure a relative arrangement relationship between marks by picking up images of a plurality of marks in an actual space by an image pickup device, an arrangement relationship between a mark included in a first image and a mark included in a second image is obtained by using arrangement relationships which are; an arrangement relationship between a common mark, which is commonly included in the first image and the second image and is temporarily arranged in the actual space, and a mark included in the first image; and an arrangement relationship between the common mark and a mark included in the second image.
Inventors:
TAKEMOTO RIKA (JP)
UCHIYAMA SHINJI (JP)
UCHIYAMA SHINJI (JP)
Application Number:
PCT/JP2006/301620
Publication Date:
August 10, 2006
Filing Date:
February 01, 2006
Export Citation:
Assignee:
CANON KK (JP)
TAKEMOTO RIKA (JP)
UCHIYAMA SHINJI (JP)
TAKEMOTO RIKA (JP)
UCHIYAMA SHINJI (JP)
International Classes:
G01B11/00; G01B11/26; G06T1/00
Foreign References:
| JP2002156229A | 2002-05-31 | |||
| JP2004342067A | 2004-12-02 | |||
| JP2002071313A | 2002-03-08 | |||
| JP2000041173A | 2000-02-08 |
Attorney, Agent or Firm:
Ohtsuka, Yasunori (SHUWA KIOICHO PARK BLDG. 3-6 KIOICH, CHIYODA-KU Tokyo94, JP)
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