Title:
MARK INSPECTION DEVICE, MARK INSPECTION METHOD AND ARTICLE INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/021832
Kind Code:
A1
Abstract:
The present invention accurately inspects a marked region including a marked section in which a mark has been applied to the surface of an article. A mark inspection device for inspecting, within the surface of an article, a marked region including a marked section in which a mark for identifying the article has been applied, the mark inspection device being provided with: a reference image storage unit that stores, as a reference image, an image of the article with no marks or defects; an imaging unit that images the article; a mark determination unit that acquires a marked region image by removing a portion corresponding to a marked region from an article image acquired by using the imaging unit to image the article to be inspected, and that performs character recognition of the marked section on the marked region image to determine whether a mark has been appropriately applied; and a mark periphery determination unit that compares the reference image to a mark periphery image obtained by removing an image of the marked section from the marked region image, and determines whether there is a defect in the mark periphery section obtained by excluding the marked section from the marked region.
Inventors:
NAITO SHUN (JP)
Application Number:
PCT/JP2019/020192
Publication Date:
January 30, 2020
Filing Date:
May 22, 2019
Export Citation:
Assignee:
SCREEN HOLDINGS CO LTD (JP)
International Classes:
G01N21/88; G06T7/00; G06V30/10
Foreign References:
| JP2001126064A | 2001-05-11 | |||
| JPH07131779A | 1995-05-19 | |||
| JP2016057075A | 2016-04-21 |
Other References:
See also references of EP 3832539A4
Attorney, Agent or Firm:
FURIKADO, Shoichi et al. (JP)
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