MARKER, METHOD FOR MANUFACTURING MARKER, AND DETECTION TARGET

Title:

MARKER, METHOD FOR MANUFACTURING MARKER, AND DETECTION TARGET

Document Type and Number:

WIPO Patent Application WO/2021/157484

Kind Code:

A1

Abstract:

Provided is a high-precision marker which is easy to manufacture.　A marker 1 is provided with a base material layer 10, a first layer 20 which is laminated onto one surface of the base material layer 10, and which is observed in a first color, and a second layer 30 which is partially laminated onto the first layer 20, is observed in a second color different from the first color, and partially conceals the first layer 20, wherein the first layer 20 is observable in a region in which the second layer 30 is not laminated, and the second layer 30 is formed by means of a resist material.

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Inventors:

FURUKAWA TADASHI (JP)
OOKAWA KOUJIRO (JP)
TANIGUCHI YUKIO (JP)
FUJISAKI HIDEAKI (JP)
KASHIMA KEIJI (JP)

Application Number:

PCT/JP2021/003291

Publication Date:

August 12, 2021

Filing Date:

January 29, 2021

Export Citation:

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Assignee:

DAINIPPON PRINTING CO LTD (JP)

International Classes:

G01B11/00; G01B11/26; G01C15/02; G01C15/06; G02B5/02; G03F7/004; G03F7/09

Foreign References:

JP2017116521A	2017-06-29
JP2012237597A	2012-12-06
US20180188663A1	2018-07-05
JP2001255118A	2001-09-21
JPH05312521A	1993-11-22
US8625107B2	2014-01-07

Other References: