Title:
MASS ANALYSIS METHOD AND APPARATUS USING SCANNER LIGHT SOURCE
Document Type and Number:
WIPO Patent Application WO/2013/094799
Kind Code:
A1
Abstract:
The present invention relates to a mass analysis method and apparatus using a scanner light source, and more particularly, to a measurer for analyzing a mass of a sample ionized by the scanner light source. The mass analysis apparatus according to the present invention comprises: a laser portion which emits laser; a scanner module which performs driving such that the laser emitted by the laser portion irradiates a predetermined region; a sample holder which receives the laser from the scanner module and holds the sample; a second high voltage power source which supplies a voltage to the sample holder; a first ion optical system disposed at a predetermined distance away from the sample holder and forming a voltage so as to accelerate the ionized sample held by the sample holder; and a first high voltage power source which supplies a voltage to the first ion optical system.
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Inventors:
LEE HYUNG MAN (KR)
PARK SUN SEOB (KR)
PARK SUN SEOB (KR)
Application Number:
PCT/KR2011/010285
Publication Date:
June 27, 2013
Filing Date:
December 29, 2011
Export Citation:
Assignee:
KOREA ELECTRONICS TECHNOLOGY (KR)
LEE HYUNG MAN (KR)
PARK SUN SEOB (KR)
LEE HYUNG MAN (KR)
PARK SUN SEOB (KR)
International Classes:
G01N27/62; H01J49/26
Foreign References:
| US20050279929A1 | 2005-12-22 | |||
| US20090039282A1 | 2009-02-12 | |||
| JP2001041931A | 2001-02-16 |
Attorney, Agent or Firm:
DARAE IP FIRM (KR)
특허법인 다래 (KR)
특허법인 다래 (KR)
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Claims: