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Patent Searching and Data


Title:
MASS ANALYSIS SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2014/041886
Kind Code:
A1
Abstract:
This mass analysis system has: a mass analysis unit (110) for measuring a sample and outputting a mass spectrum; a space charge effect correction unit (202) for correcting for the space charge effect on the basis of the mass spectrum and outputting same as a corrected spectrum; and a correction reliability calculation unit (203) for calculating the reliability when a correction has been made on the basis of the mass spectrum. According to the present invention, the reliability of the effect of correcting for the space charge effect can be accurately assessed.

Inventors:
KAWAGUCHI YOHEI (JP)
SUGIYAMA MASUYUKI (JP)
NISHIMURA KAZUSHIGE (JP)
KANEKO AKIHITO (JP)
KUMANO SHUN (JP)
TOGAMI MASAHITO (JP)
HASHIMOTO YUICHIRO (JP)
YAMADA MASUYOSHI (JP)
Application Number:
JP2013/068837
Publication Date:
March 20, 2014
Filing Date:
July 10, 2013
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N27/62
Foreign References:
JP2010529457A2010-08-26
JP2009014424A2009-01-22
Other References:
YOSHIHIRO MIZUTANI ET AL.: "Molecular Dynamical Simulation of Space-Charge Effect in a Time-of-Flight Spectrometry", JOURNAL OF THE SPECTROSCOPICAL RESEARCH OF JAPAN, vol. 52, no. 5, 15 October 2003 (2003-10-15), pages 281 - 285
Attorney, Agent or Firm:
HIRAKI Yusuke et al. (JP)
Yusuke Hiraki (JP)
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