Title:
MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD
Document Type and Number:
WIPO Patent Application WO/2018/163956
Kind Code:
A1
Abstract:
A mass spectrometry device 200 according to one aspect of the present invention is provided with: a sample supporting body 2 provided with a base plate 21 on which a sample 10 is placed and which is provided with a plurality of through-holes S penetrating from one surface 21a to another surface 21b, and an electrically conductive layer 23 covering at least a part of the one surface 21a in which the through-holes S are not provided; a sample stage 1 configured in such a way that the sample supporting body 2 is placed thereon in such a way that the other surface 21b faces the sample 10; a laser radiating unit 201 which controls radiation of a laser L in such a way that the laser L is radiated onto an imaging target region R1 of the one surface 21a; and a detector 203 which detects the sample 10 that has been ionized by means of the laser L radiation, in a state in which a positional relationship of the sample 10 in the imaging target region R1 is maintained.
Inventors:
NAITO YASUHIDE (JP)
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
Application Number:
PCT/JP2018/007753
Publication Date:
September 13, 2018
Filing Date:
March 01, 2018
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01N27/62; G01N27/64
Domestic Patent References:
| WO2017038709A1 | 2017-03-09 |
Foreign References:
| JP2009080106A | 2009-04-16 | |||
| JP2007157353A | 2007-06-21 | |||
| JPS5129628B1 | 1976-08-26 | |||
| US6288390B1 | 2001-09-11 |
Other References:
See also references of EP 3594675A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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