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Title:
MASS SPECTROMETRY DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/109895
Kind Code:
A1
Abstract:
A measurement unit (1) executes product ion scanning measurement for a sample containing a target compound by using, as a precursor ion, a known m/z value of an ion derived from the compound, thereby obtaining profile spectrum data. In a data processing unit (2A), a peak detecting unit (22) detects peaks in the profile spectrum, and for each of the peaks detected, a product-ion m/z-value obtaining unit (23) obtains an m/z value corresponding to the maximum intensity as an m/z value of the product ion. A pseudo-MRM measurement-data extracting unit (24) sets the m/z value of the precursor ion and the m/z value of the product ion as an MRM transition, extracts the maximum intensity at the peak attributable to the product ion as a signal intensity value in the MRM transition, and saves the signal intensity value in a storage unit (25) as pseudo-MRM measurement data. This makes it possible to obtain quantitative information reflecting the concentration of the target compound just by product ion scanning measurement without having to execute MRM measurement.

Inventors:
YAMAMOTO HIDEKI (JP)
UMEMURA YOSHIKATSU (JP)
Application Number:
PCT/JP2016/087374
Publication Date:
June 21, 2018
Filing Date:
December 15, 2016
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/40; G01N27/62; H01J49/42
Domestic Patent References:
WO2014076766A12014-05-22
Foreign References:
JP2011249109A2011-12-08
JP2013015485A2013-01-24
JP2010019655A2010-01-28
JP2015076338A2015-04-20
JP2015156397A2015-08-27
JP2013224858A2013-10-31
Other References:
See also references of EP 3557241A4
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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