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Patent Searching and Data


Title:
MASS SPECTROMETRY DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/229954
Kind Code:
A1
Abstract:
After an analysis of a standard sample is performed for a predetermined period of time (S1 through S3), multiple ion optical elements such as ion guides are sequentially selected one by one, and a direct-current voltage of a different polarity from that used during the analysis is temporarily applied thereto. While doing so, intensity data pertaining to ions having a specific m/z value is continuously collected (S4 through S7). After the data is collected in this manner, an ion intensity ratio between before and after the application of the direct-current voltage of the different polarity is calculated for each ion optical element, and whether or not the ratio is equal to or greater than a predetermined threshold value is determined. If an ion optical element is dirty and has charged up, the charge-up is resolved when the direct-current voltage of the different polarity from that used during the analysis is applied thereto, and the ion intensity is enhanced. Thus, an ion optical element is estimated as having charged up when the ion intensity ratio is equal to or greater than the predetermined threshold value, and the estimation result is displayed on a display unit (S9 through S11). In this way, a worker can be notified of a contaminated site among the multiple ion optical elements, resulting in an improvement in the ease of maintenance.

Inventors:
UEDA MANABU (JP)
Application Number:
PCT/JP2018/021044
Publication Date:
December 05, 2019
Filing Date:
May 31, 2018
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/06; G01N27/62; H01J49/42
Domestic Patent References:
WO2014181396A12014-11-13
Foreign References:
JPH10106483A1998-04-24
JPH1154083A1999-02-26
JPS6011155A1985-01-21
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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