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Patent Searching and Data


Title:
MASS SPECTROSCOPE AND MASS SPECTROMETRY
Document Type and Number:
WIPO Patent Application WO/2010/010780
Kind Code:
A1
Abstract:
Provided is a mass spectroscope employing electron capture dissociation wherein the peak number of detectable fragment ions is increased. The mass spectroscope comprises an ion source (2) for generating ions from a sample, an ion trap (3) for storing and selecting ions, an ion dissociation section (4) performing electron capture dissociation on ions, and a time-of-flight mass spectrometry section (7) performing mass spectrometry on ions, wherein the reaction time of electron capture dissociation is variable depending on the valence of ions subjected to mass spectrometry.

Inventors:
YOSHIOKA SHINJI (JP)
TAKEDA AKIHIRO (JP)
SHISHIKA TSUKASA (JP)
Application Number:
PCT/JP2009/061551
Publication Date:
January 28, 2010
Filing Date:
June 18, 2009
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
YOSHIOKA SHINJI (JP)
TAKEDA AKIHIRO (JP)
SHISHIKA TSUKASA (JP)
International Classes:
G01N27/64; H01J49/06; H01J49/40; H01J49/42
Foreign References:
JP2008096353A2008-04-24
JP2005091344A2005-04-07
JP2006185781A2006-07-13
JP2006351532A2006-12-28
Attorney, Agent or Firm:
INOUE, Manabu (6-1, Marunouchi 1-chome, Chiyoda-ku, TOKYO 20, JP)
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