MATERIAL TESTING DEVICE, AND TEST PIECE HOLDER AND INSPECTION METHOD USED IN SAME

WIPO Patent Application WO/2014/174574

A1

A material testing device capable of accurately capturing the moment at which a test piece breaks is provided. A material testing device (1) provided with a support (11) for supporting a test piece (2), a presser (10) for applying a load to the test piece (2), a light source (21) for irradiating light from the front-surface side of the test piece (2) onto the range to be observed on the test piece (2), and an imaging element (22) for detecting, from the front-surface side of the test piece (2), light from the range to be observed on the test piece (2), wherein a half mirror (23) and a retroreflector (40) that is disposed behind the test piece (2) and retroreflects light in the same direction as the incident direction are provided and the material testing device (1) is configured such that light from the light source (21) is irradiated onto the range to be observed on the test piece (2) via the half mirror (23) and after the light that has passed through the range to be observed on the test piece (2) is retroreflected by the retroreflector (40), the light passes through the range to be observed on the test piece (2) again and is detected by the imaging element (22) after passing through the half mirror (23).

JP2013217829

BENDING TEST DEVICE AND BENDING TEST METHOD USING THE SAME

KAWAGUCHI YASUNORI (JP)
TAKUBO KENJI (JP)

PCT/JP2013/061789

October 30, 2014

April 22, 2013

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SHIMADZU CORP (JP)

G01N3/20; G01N21/84

JP2007225519A	2007-09-06
JPH04346053A	1992-12-01
JP2004101194A	2004-04-02

KASHIMA, YOSHIO (JP)
KAJIMA Yoshio (JP)

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