Title:
MATERIAL TESTING MACHINE
Document Type and Number:
WIPO Patent Application WO/2020/026363
Kind Code:
A1
Abstract:
A master unit (40) is provided with a synchronous signal source (41) for generating a synchronous signal, and a synchronous signal distribution adjustment circuit (42) for adjusting the timing of distribution of the synchronous signal to slave units (A), (B). The synchronous signal distribution adjustment circuit (42) has: a period measurement circuit (43) for measuring the period Ts of the synchronous signal outputted from the synchronous signal source (41); a time difference measurement circuit (44) for measuring a time difference Td which is the difference between the time of the synchronous signal transmitted from the master unit (40) to the slave units (A), (B) and the time of the synchronous signal returned from the slave units (A), (B) to the master unit (40); and a delay circuit (45) for delaying the transmission time of the synchronous signal transmitted from the master unit (40) to the slave units (A), (B) on the basis of the time difference Td and the period Ts of the synchronous signal.
Inventors:
TSUJI HIROSHI (JP)
Application Number:
PCT/JP2018/028755
Publication Date:
February 06, 2020
Filing Date:
July 31, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N3/06
Domestic Patent References:
| WO2017145255A1 | 2017-08-31 |
Foreign References:
| JPH03110353U | 1991-11-12 | |||
| JPS49131486A | 1974-12-17 | |||
| JP2010117243A | 2010-05-27 | |||
| JPH10185788A | 1998-07-14 | |||
| JP2008076299A | 2008-04-03 | |||
| JP2008076300A | 2008-04-03 |
Other References:
See also references of EP 3832287A4
Attorney, Agent or Firm:
OTSUBO Takashi (JP)
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