Title:
MEASUREING DEVICE AND METHOD OF MANUFACTURING MEASUREING DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/208462
Kind Code:
A1
Abstract:
The present invention reduces the deviation of the relative spectral responsivity of a measuring device from a spectral responsivity function without increasing the manufacturing cost of the measuring device. In a luminance meter, a light beam to be measured is branched by a bundle fiber. Each of the plurality of light beams that are obtained passes through a color filter. The relative spectral responsivity achieved by each of the plurality of color filters is made to approximate a standard relative spectral sensitivity. Each of the plurality of light beams that has passed through a color filter is received by a light receiving sensor. Each of the plurality of light receiving sensors outputs an electrical signal in accordance with the light beam received. A derivation mechanism derives a luminance value corresponding to the spectral distribution of the light beams being measured from the plurality of electrical signals that are obtained.
Inventors:
TSURUTANI KATSUTOSHI (JP)
KASHIHARA MASATO (JP)
KADOWAKI YUTAKA (JP)
MARUCHI TOSHIO (JP)
ASO KOHEI (JP)
KASHIHARA MASATO (JP)
KADOWAKI YUTAKA (JP)
MARUCHI TOSHIO (JP)
ASO KOHEI (JP)
Application Number:
PCT/JP2016/067712
Publication Date:
December 29, 2016
Filing Date:
June 15, 2016
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J1/42; G01J1/04; G01J3/51; G01M11/00
Domestic Patent References:
WO2011121896A1 | 2011-10-06 |
Foreign References:
JP2011107114A | 2011-06-02 | |||
JP2010139446A | 2010-06-24 | |||
JPS63154920A | 1988-06-28 | |||
JPH04113235A | 1992-04-14 | |||
JPH0245718A | 1990-02-15 | |||
JPS57204427A | 1982-12-15 | |||
JPH05281021A | 1993-10-29 | |||
US5149182A | 1992-09-22 |
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
Hidetoshi Yoshitake (JP)
Hidetoshi Yoshitake (JP)
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