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Patent Searching and Data


Title:
MEASUREMENT ABNORMALITY DETECTION METHOD AND SURFACE PLASMON-FIELD ENHANCED FLUORESCENCE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/171139
Kind Code:
A1
Abstract:
The present invention pertains to a method for detecting measurement abnormalities in measurements made using surface plasmon-field enhanced fluorescence spectroscopy. A sensor chip is provided that has a prism comprising a dielectric, a conductor film disposed on a surface of the prism, and a capturing body fixed onto the conductor film. Light is irradiated from the prism side to the conductor film so as to be totally reflected at the interface of the prism and the conductor film, and optical characteristic values for detecting measurement abnormalities are measured. Measurement abnormalities are detected on the basis of the optical characteristic values.

Inventors:
MIYAZAKI KOJI
MATSUO MASATAKA
TSUKAGOSHI MASANORI
WADA TAKESHI
HIKAGE NAOKI
Application Number:
PCT/JP2014/002145
Publication Date:
October 23, 2014
Filing Date:
April 15, 2014
Export Citation:
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Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N21/64
Domestic Patent References:
WO2011130625A12011-10-20
Foreign References:
JP2013002858A2013-01-07
JP2013057580A2013-03-28
JP2012117931A2012-06-21
JP2011163839A2011-08-25
JP2007173786A2007-07-05
Attorney, Agent or Firm:
WASHIDA, KIMIHITO (JP)
Koichi Washida (JP)
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