Title:
MEASUREMENT APPARATUS, IMAGING APPARATUS, MEASUREMENT SYSTEM, CONTROL METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/262389
Kind Code:
A1
Abstract:
A measurement apparatus comprises: a projection device for projecting a predetermined pattern onto a subject; an imaging system for capturing a group of images from at least two different viewpoints; and a relative position calculating means for determining a position of the projection device relative to at least one of the viewpoints from a position of a pattern image on the group of images and a positional relationship between the viewpoints, wherein a distance between the viewpoints is shorter than a distance between the projection device and any of the viewpoints, and distance information of the subject is acquired on the basis of the relative position and the position of the pattern image on the images from the viewpoints.
More Like This:
Inventors:
TAKAGI AKINARI (JP)
Application Number:
PCT/JP2020/024635
Publication Date:
December 30, 2020
Filing Date:
June 23, 2020
Export Citation:
Assignee:
CANON KK (JP)
International Classes:
G01B11/00; G01B11/245; G01B11/25; G01C3/06; G06T7/529; G06T7/593
Foreign References:
| JPH0150982B2 | 1989-11-01 | |||
| JP2012058076A | 2012-03-22 | |||
| JPH0942940A | 1997-02-14 | |||
| JP2017020971A | 2017-01-26 |
Attorney, Agent or Firm:
OHTSUKA, Yasunori et al. (JP)
Download PDF: