Title:
MEASUREMENT APPARATUS AND METHOD FOR MEASURING CURVATURE OF DISPLAY PANEL
Document Type and Number:
WIPO Patent Application WO/2018/120901
Kind Code:
A1
Abstract:
A measurement apparatus (100) and a method for measuring the curvature of a display panel (50). The measurement apparatus (100) comprises: a measurement platform (10) used for bearing and conveying the display panel (50); a distance sensor (30) disposed on the measurement platform (10) and used for measuring a first height value H1 between the end portion of the display panel (50) and the distance sensor (30); and a controller (70) electrically connected to the distance sensor (30). The controller (70) comprises a processor (71) and a memory (73). The memory (73) stores executable instructions. The processor (71) executes the executable instructions. The executable instructions comprise: sending the first height value H1 to the controller (70), the controller (70) comparing the first height value H1 with a reference height value H2 and giving an alarm if a difference value ΔH between the first height value H1 and the reference height value H2 is greater than a preset threshold value H.
Inventors:
HUANG JUNQIN (CN)
Application Number:
PCT/CN2017/100250
Publication Date:
July 05, 2018
Filing Date:
September 01, 2017
Export Citation:
Assignee:
HKC CORP LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
International Classes:
G02F1/13; G01B5/20; G01B11/24
Domestic Patent References:
| WO2016106276A1 | 2016-06-30 |
Foreign References:
| CN106681032A | 2017-05-17 | |||
| CN105509663A | 2016-04-20 | |||
| CN203083535U | 2013-07-24 | |||
| CN101893772A | 2010-11-24 | |||
| CN105783794A | 2016-07-20 |
Attorney, Agent or Firm:
CENFO INTELLECTUAL PROPERTY AGENCY (CN)
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